![eBeam-Metrologiegeräte von Applied Materials im Reinraum des Fraunhofer IPMS. © Fraunhofer IPMS / Applied Materials’ eBeam metrology equipment at cleanroom of Fraunhofer IPMS. © Fraunhofer IPMS eBeam-Metrologiegeräte von Applied Materials im Reinraum des Fraunhofer IPMS. © Fraunhofer IPMS / Applied Materials’ eBeam metrology equipment at cleanroom of Fraunhofer IPMS. © Fraunhofer IPMS](/uploads/images/_scale/ipmsamatmetrologyhub_169_626x352.jpg)
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- Electronics (wafers, semiconductors, microchips,...)
Launch of European Semiconductor- Metrology Technology Hub
Applied Materials and Fraunhofer IPMS launch European Semiconductor- Metrology Technology Hub
– New hub will provide state-of-the-art metrology systems to accelerate semiconductor research and enhance development projects with chipmakers and ecosystem partners across Europe, particularly in ICAPS* market segments
– Collaboration to accelerate learning, develop novel methods and prove new me…