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Buchta Vaisala Ecolab PPS

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More see, faster understand � inspection systems for highest throughput

Mehr sehen, schneller verstehen ? Inspektionssysteme für höchsten Durchsatz
Mehr sehen, schneller verstehen ? Inspektionssysteme für höchsten Durchsatz
In the semiconductor industry must be the inspection, process control and error analysis of Wafern fast, safe and ergonomic. With the inspection microscopes Leica DM8000 M and Leica DM12000 M brings Leica Microsystems a new line on the market, which fulfills these requirements optimally. The new instruments are alternatively available for the inspection of 8 - or 12-Zoll-Wafern. More overview with that macro mode with the integrated macro mode the inspection microscopes Leica DM8000 M and DM12000 M offer an overview of the sample than conventional overview objectives, larger up to four times. Like that the entire range knows fast and surely on possible defects scanned will LED lighting for cleaner ArbeitsumgebungIm Leica DM8000 M and DM12000 M is the LED lighting into the stand integrated. Thus the air flow in the pure area is led optimally around the microscope, since lamp houses are void completely. In addition the modern power LEDs have a long life span with low current consumption. That saves costs and is more pollution free. Also the optionally available i-LINE UV lighting basedly on LED-technology-highest dissolution from each BlickwinkelDer new Oblique UV mode combines the diagonal lighting with i-LINE UV light. So the sample can be regarded fast and simply by all sides, in 3D and in highest resolution. Comfort when working increases Qualit�tWeil comfort when working a condition for more efficiency and thus better quality is, the functional elements after highest ergonomic yardsticks was arranged. All control elements are into the stand integrated and easy to reach, so that after switching eyes and hands do not have to be taken by the microscope. With individually adjustable Ergotuben and focus buttons the inspection system can be adapted to each user. Focus Finder, MEMORY function and the integrated lighting and contrast manager facilitate the operation and help error to avoid. System integration: Perfectly one on the other abgestimmtLeica Microsystems offers the Leica DM8000 M and DM12000 M as complete system: Microscope, camera and software are co-ordinated perfectly. In addition the system can be supplemented by special inspection and Reviewsoftware. Compatibility to Waferloadern of different manufacturers round the offer to the complete system off. Picture: More picture information in shorter time: New optical functions of the Leica DM8000 M/DM12000 M provide for more dissolution and higher throughput with the inspection.

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